NO | 測試項目 Test Item | 試驗方法及條件 (test Condition & Method) | 規(guī)格Standard
|
6.1 | 接觸阻抗contact impedance | FFC與導(dǎo)體之間的接觸電阻(Measured the resistance of mated FFC )
| 30毫歐以下 (below 30mΩ) |
6.2 | 絕緣阻抗insulation impedance | 在端子之間和端子與殼之間加DC500V條件下持續(xù)1分鐘測量among terminals or between terminal and shell, under condition of DC500V ,last 1min to test | 1000兆歐以上 ( above100MΩ) |
6.3 | 耐電壓disruptive test | 在端子之間和端子與殼之間加AC 500V(50H或60H)條件下持續(xù)1分鐘測量among terminals or between terminals and shell, under condition of AC 500V(50H or 60H),last 1min to test | 無擊穿現(xiàn)象出現(xiàn) ( without disruptive ) |
FFC/FPC連接器
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